hot carrier injection temperature dependence

相關問題 & 資訊整理

hot carrier injection temperature dependence

由 M Kamal 著作 · 2016 — This paper presents an efficient temperature dependent hot carrier injection reliability simulation flow which is scalable. The flow makes use of some efficient ... ,由 Y Wang 著作 · 2022 · 被引用 7 次 — High temperature improves the HCI reliability in the conventional MOSFET with long channels in which the energy of carriers can be relaxed. ,The term hot refers to the effective temperature used to model carrier density, not to the overall temperature of the device. Since the charge carriers can ... ,由 N Kumar 著作 · 2022 · 被引用 13 次 — The change in surrounding temperature affects its performances, such as hot carrier injection (HCI) degradation, Linearity distortion, and analog performance. ,A new hot-carrier-injection (HCI) effect is observed for the n-channel devices, in that the temperature dependence of the device parameter drift changes ... ,由 S Tyaginov 著作 · 被引用 2 次 — We apply our physics-based model for hot- carrier degradation to analyze the temperature behavior of this detrimental phenomenon. This behavior is interpreted ... ,由 SH Hong 著作 · 1999 · 被引用 7 次 — This paper reports a new experimental finding on the temperature dependence of the substrate current and hot carrier induced device degradation at low gate ... ,由 P Heremans 著作 · 1990 · 被引用 115 次 — In the present study, the technique of [lo] is first in- vestigated in more detail, and then used to determine the temperature dependence of the interface trap ...,2018. The temperature dependence of hot carrier degradation (HCD) in FinFET is observed to vary with bias conditions, channel local temperature and degradation ...

相關軟體 LEGO Digital Designer 資訊

LEGO Digital Designer
LEGO Digital Designer 允許你建立幾乎任何你的想像力可以創建,使用虛擬樂高積木在您的 Windows.隨著免費的數字設計軟件,你可以建立絕對的虛擬樂高積木在您的計算機上的任何東西。然後,您可以購買真正的磚塊,在樂高工廠在線創建您的作品,也可以打印出磚塊,並將其帶到任何樂高樂園主題樂園或樂高商店.使用 LEGO Digital Designer MINDSTORMS 模式,您可以... LEGO Digital Designer 軟體介紹

hot carrier injection temperature dependence 相關參考資料
An efficient temperature dependent hot carrier injection ...

由 M Kamal 著作 · 2016 — This paper presents an efficient temperature dependent hot carrier injection reliability simulation flow which is scalable. The flow makes use of some efficient ...

https://www.sciencedirect.com

Hot Carrier Injection Reliability in Nanoscale Field Effect ...

由 Y Wang 著作 · 2022 · 被引用 7 次 — High temperature improves the HCI reliability in the conventional MOSFET with long channels in which the energy of carriers can be relaxed.

https://www.mdpi.com

Hot-carrier injection

The term hot refers to the effective temperature used to model carrier density, not to the overall temperature of the device. Since the charge carriers can ...

https://en.wikipedia.org

Impact of Temperature Variation on Analog, Hot-Carrier ...

由 N Kumar 著作 · 2022 · 被引用 13 次 — The change in surrounding temperature affects its performances, such as hot carrier injection (HCI) degradation, Linearity distortion, and analog performance.

https://link.springer.com

Investigation on the temperature dependence of the HCI ...

A new hot-carrier-injection (HCI) effect is observed for the n-channel devices, in that the temperature dependence of the device parameter drift changes ...

https://www.researchgate.net

On the Temperature Behavior of Hot-Carrier Degradation

由 S Tyaginov 著作 · 被引用 2 次 — We apply our physics-based model for hot- carrier degradation to analyze the temperature behavior of this detrimental phenomenon. This behavior is interpreted ...

https://www.iue.tuwien.ac.at

Temperature dependence of hot carrier induced MOSFET ...

由 SH Hong 著作 · 1999 · 被引用 7 次 — This paper reports a new experimental finding on the temperature dependence of the substrate current and hot carrier induced device degradation at low gate ...

https://www.sciencedirect.com

Temperature dependence of the channel hot-carrier ...

由 P Heremans 著作 · 1990 · 被引用 115 次 — In the present study, the technique of [lo] is first in- vestigated in more detail, and then used to determine the temperature dependence of the interface tr...

https://ieeexplore.ieee.org

[PDF] Analysis on Temperature Dependence of Hot Carrier ...

2018. The temperature dependence of hot carrier degradation (HCD) in FinFET is observed to vary with bias conditions, channel local temperature and degradation ...

https://www.semanticscholar.or