redundancy repair
PDF | In this paper, a built-in self repair technique for word-oriented two-port SRAM memories is presented. The technique is implemented by ...,Both the redundancy repair and ECC techniques have been widely used for enhancing the yield and reliability of memory chips. Specifically, the redundancy ... , , As advances in memory density and capacity result in an increase in the probability of fault occurrence, many studies on built-in redundancy ...,Summary form only given. Redundancy repair of high-density commodity flash memory is an effective technique to improve per-wafer yield by trading-off incre. ,冗餘修復（Redundancy Repair）技巧與錯誤更正碼（Error Correction Code, ECC）是常用來增進記憶體晶片良率與可靠度的兩種方法。傳統上，前者是用來修復硬 ... , 一為設計備援用的記憶體細胞，並用雷射方式來修補(Redundancy & Laser Repair)。二為錯誤校正碼(Error Correction Code)，我們可以使用位元 ...
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 redundancy repair 相關參考資料
(PDF) Built-in Self Repair for SRAM Array using Redundancy
PDF | In this paper, a built-in self repair technique for word-oriented two-port SRAM memories is presented. The technique is implemented by ... https://www.researchgate.net An integrated ECC and redundancy repair ... - IEEE Xplore
Both the redundancy repair and ECC techniques have been widely used for enhancing the yield and reliability of memory chips. Specifically, the redundancy ... https://ieeexplore.ieee.org An Integrated ECC and Redundancy Repair Scheme for ...
http://graphics.stanford.edu Dynamic Built-In Redundancy Analysis for Memory Repair ...
As advances in memory density and capacity result in an increase in the probability of fault occurrence, many studies on built-in redundancy ... https://ieeexplore.ieee.org Test time impact of redundancy repair in embedded flash ...
Summary form only given. Redundancy repair of high-density commodity flash memory is an effective technique to improve per-wafer yield by trading-off incre. https://ieeexplore.ieee.org 博碩士論文行動網
冗餘修復（Redundancy Repair）技巧與錯誤更正碼（Error Correction Code, ECC）是常用來增進記憶體晶片良率與可靠度的兩種方法。傳統上，前者是用來修復硬 ... https://ndltd.ncl.edu.tw 白安鵬--半導體積體電路測試技術部落格: D.再談記憶體測試
一為設計備援用的記憶體細胞，並用雷射方式來修補(Redundancy & Laser Repair)。二為錯誤校正碼(Error Correction Code)，我們可以使用位元 ... http://ictesting-tom.blogspot. |