SRAM repair yield
由 X Qi 著作 · 2018 · 被引用 1 次 — Abstract: A simplified yield model for static random access memory (SRAM) repair has been proposed. This simplified model provides minimum ... ,由 X Qi 著作 · 2018 · 被引用 1 次 — Index Terms—Critical area, redundancy, repair scheme, static random access memory (SRAM), yield. I. INTRODUCTION. ADVANCED technology in the ... ,由 M Ottavi 著作 · 2006 · 被引用 9 次 — paper, two yield-calculation methodologies for SRAM arrays are ... Two repair yield-evaluation ... use of purely ATE-based test and repair techniques. ,由 M Ottavi 著作 · 2004 · 被引用 4 次 — With the increasing needs for memory testing and repair, yield evaluation is an essential decision-making factor to define redundancy allocation and testing ... ,Two repair yield-evaluation methods for one-dimensional redundant memory arrays are ... methods calculate the yield by considering SRAM repair solutions. ,A simplified yield model for static random access memory (SRAM) repair has been proposed. This simplified model provides minimum required redundancy to ... ,Index words: Poisson's formula, yield, defect density, repair rate. Abstract. This paper describes a model developed to calculate the. ,2018年11月1日 — A simplified yield model for static random access memory (SRAM) repair has been proposed, which provides minimum required redundancy to ... ,由 X Qi 著作 · 2018 · 被引用 1 次 — A simplified yield model for static random access memory (SRAM) repair has been proposed. This simplified model provides minimum required redundancy to ...
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 SRAM repair yield 相關參考資料
A Simplified Yield Model for SRAM Repair in Advanced ...
由 X Qi 著作 · 2018 · 被引用 1 次 — Abstract: A simplified yield model for static random access memory (SRAM) repair has been proposed. This simplified model provides minimum ... https://ieeexplore.ieee.org A Simplified Yield Model for SRAM Repair in ... - IEEE Xplore
由 X Qi 著作 · 2018 · 被引用 1 次 — Index Terms—Critical area, redundancy, repair scheme, static random access memory (SRAM), yield. I. INTRODUCTION. ADVANCED technology in the ... https://ieeexplore.ieee.org Evaluating the Yield of Repairable SRAMs for ATE - IEEE Xplore
由 M Ottavi 著作 · 2006 · 被引用 9 次 — paper, two yield-calculation methodologies for SRAM arrays are ... Two repair yield-evaluation ... use of purely ATE-based test and repair techniques. https://ieeexplore.ieee.org Yield evaluation methods of SRAM arrays: a comparative study
由 M Ottavi 著作 · 2004 · 被引用 4 次 — With the increasing needs for memory testing and repair, yield evaluation is an essential decision-making factor to define redundancy allocation and testing ... https://ieeexplore.ieee.org (PDF) Evaluating the yield of repairable SRAMs for ATE
Two repair yield-evaluation methods for one-dimensional redundant memory arrays are ... methods calculate the yield by considering SRAM repair solutions. https://www.researchgate.net A Simplified Yield Model for SRAM Repair in ... - ResearchGate
A simplified yield model for static random access memory (SRAM) repair has been proposed. This simplified model provides minimum required redundancy to ... https://www.researchgate.net Redundancy Yield Model for SRAMS - SMTnet
Index words: Poisson's formula, yield, defect density, repair rate. Abstract. This paper describes a model developed to calculate the. https://smtnet.com A Simplified Yield Model for SRAM Repair ... - Semantic Scholar
2018年11月1日 — A simplified yield model for static random access memory (SRAM) repair has been proposed, which provides minimum required redundancy to ... https://www.semanticscholar.or A Simplified Yield Model for SRAM ... - IEEE Computer Society
由 X Qi 著作 · 2018 · 被引用 1 次 — A simplified yield model for static random access memory (SRAM) repair has been proposed. This simplified model provides minimum required redundancy to ... https://www.computer.org |