Address decoder fault
In this paper the effects of interference and shorts between the address decoders of the two ports on the fault modeling are investigated. Fault models and ... ,由 S Hamdioui 著作 · 被引用 9 次 — lished on address decoder faults (AFs) in MP memories; therefore, AFs will be the subject of ... fault models for address decoders in 2P memories; it de-. ,由 S Hamdioui 著作 · 1998 · 被引用 9 次 — Abstract: A two-port memory contains two duplicated sets of address decoders which operate independently. In this paper the effects of interference and ... ,In this paper we present an efficient test concept for detection of delay faults in memory address decoders based on the march test tactic. ,Detect timing faults affecting internal device- under- test circuitry. * E.g., detect slow sense amplifier operation, slow address decoder operation, etc. ,2015年6月29日 — Address decoder Faults (ADFs): Row and column decoder comprises the address decoder of a memory. From the context of memory testing four ... ,2014年9月28日 — What ASOF Faults? Address decoder stuck-at faults are caused by resistive open and capacitive coupling between address lines. As semiconductor ... ,decoder fault detecting means for detecting incorrect address decoder operation in response to said input address and said address identifying data if said ...
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 Address decoder fault 相關參考資料
(PDF) Address decoder faults and their tests for two-port ...
In this paper the effects of interference and shorts between the address decoders of the two ports on the fault modeling are investigated. Fault models and ... https://www.researchgate.net Address Decoder Faults and their Tests for Two ... - CiteSeerX
由 S Hamdioui 著作 · 被引用 9 次 — lished on address decoder faults (AFs) in MP memories; therefore, AFs will be the subject of ... fault models for address decoders in 2P memories; it de-. https://citeseerx.ist.psu.edu Address decoder faults and their tests for two-port memories
由 S Hamdioui 著作 · 1998 · 被引用 9 次 — Abstract: A two-port memory contains two duplicated sets of address decoders which operate independently. In this paper the effects of interference and ... https://ieeexplore.ieee.org An organization of address decoder with a stuck-open fault.
In this paper we present an efficient test concept for detection of delay faults in memory address decoders based on the march test tactic. https://www.researchgate.net Chapter 2 RAM Functional Faults - National Central University
Detect timing faults affecting internal device- under- test circuitry. * E.g., detect slow sense amplifier operation, slow address decoder operation, etc. http://www.ee.ncu.edu.tw Memory fault models and testing - EDN
2015年6月29日 — Address decoder Faults (ADFs): Row and column decoder comprises the address decoder of a memory. From the context of memory testing four ... https://www.edn.com Targeting SoC address decoder faults using functional patterns
2014年9月28日 — What ASOF Faults? Address decoder stuck-at faults are caused by resistive open and capacitive coupling between address lines. As semiconductor ... https://www.embedded.com US20090037782A1 - Detection of address decoder faults
decoder fault detecting means for detecting incorrect address decoder operation in response to said input address and said address identifying data if said ... https://patents.google.com |